Field Emission Scanning Electron Microscopy (FE-SEM) transforms scientific imaging with unparalleled precision, driving advancements in materials science, biomedical research, and nanotechnology. As industries demand higher resolution and accuracy, FE-SEM is emerging as the go-to tool for cutting-edge research. Market Growth and Forecast The FE-SEM market is experiencing significant growth, particularly as industries like nanotechnology, semiconductor manufacturing, and battery development push the need for more precise imaging. Increasing investments in research and development and advanced technologies ensure that demand continues to grow. This trend will continue in the coming years, making FE-SEM an important tool for cross-disciplinary research. CIQTEK is actively contributing…

Based on the Dual-beam Electron Microscope DB550 independently controlled by CIQTEK, the Transmission Electron Microscope (TEM) nanoscale sample preparation of 28nm process node chips was successfully achieved. TEM verification can clearly analyze the key dimensions of each structure, providing a domestic precision detection solution for semiconductor process defect analysis and yield improvement.

CIQTEK demonstrated the remarkable capabilities of its EPR200M at The French Association of Electronic Paramagnetic Resonance (ARPE) conference. The event was marked by a presentation and an impressive turnout of attendees, with the EPR system attracting substantial attention and generating lively discussions. During the conference, CIQTEK’s booth was constantly surrounded by researchers and enthusiasts eager to learn more about the EPR200M. Even during the coffee breaks, numerous foreign researchers actively engaged in discussions around the informative posters and promotional materials displayed by CIQTEK. The company’s commitment to fostering knowledge exchange and collaboration was evident throughout the conference. In recognition of exceptional research work, the prestigious Poster Prize at…

Electron Paramagnetic Resonance (EPR) spectroscopy is a critical technique for studying the electronic properties of paramagnetic species, and temperature control plays a central role in the accuracy and reliability of EPR measurements. Variable Temperature (VT) Systems allow researchers to investigate temperature-dependent phenomena, providing a direct window into spin dynamics, phase transitions, and other subtle effects. The Role of Temperature Control in EPR Temperature is a key variable in EPR experiments. Precise control helps to: Technical Features of Modern VT Systems Contemporary VT systems are designed to cover a wide temperature range—from cryogenic levels (around 4 K using liquid helium or closed-cycle cryostats) up to around…

Scanning Electron Microscopy (SEM) has become an indispensable tool in various scientific and industrial fields, enabling researchers to explore the micro- and nanoscale world with unprecedented clarity. High-resolution SEM, in particular, has revolutionized materials science, life sciences, and semiconductor research, providing exceptional imaging capabilities and analytical precision. In Europe, where cutting-edge research and advanced manufacturing thrive, high-resolution SEM is a key driver of innovation. The Growing Demand for High-Resolution SEM in Europe Europe has long been at the forefront of scientific and technological advancements, with institutions and industries demanding ever-more precise imaging solutions. The rise of nanotechnology, semiconductor miniaturization, and biomaterial research has…

CIQTEK is pleased to announce its participation in the upcoming Experimental Nuclear Magnetic Resonance Conference (ENC) 2025 ENC-ISMAR Joint Conference. The conference is set to take place from April 6 to 10 in Pacific Grove, California. The ENC-ISMAR Joint Conference is a prominent event that brings together experts, researchers, and industry professionals from around the world to discuss advancements, breakthroughs, and applications in the field of Nuclear Magnetic Resonance (NMR) and Electron Paramagnetic Resonance (EPR) Spectrometer. The conference serves as a platform for collaboration, knowledge sharing, and the exchange of ideas on cutting-edge research and development. CIQTEK invites conference attendees to visit their booth at the…

Metal materials play an indispensable role in modern industry, and their performance directly affects product quality and service life. With the continuous development of materials science, higher requirements have been put forward for the microscopic structure and composition analysis of metal materials. As an advanced characterization tool, Scanning Electron Microscope (SEM) can provide high-resolution surface morphology information and combine with spectroscopic analysis techniques for elemental composition determination, making it an important tool in metal material research. This article aims to discuss the application of SEM technology in the characterization of metal materials and provide references and guidance for related research. Basic Principles of Scanning…

Electron Paramagnetic Resonance (EPR) spectroscopy remains an indispensable tool in the investigation of materials with unpaired electrons. Whether for fundamental research or industrial applications, recent breakthroughs are driving the technology into a new era of accessibility and precision. Here, we explore these cutting-edge developments in the EPR instrument area and examine how they are redefining the landscape of scientific discovery. 1. The Rise of EPR-AI Technology Artificial intelligence (AI) has revolutionized various scientific disciplines, and EPR is no exception. Traditional EPR spectral analysis has always demanded a high level of expertise and time investment. The advent of EPR-AI technology is changing that paradigm. Modern…

Scanning electron microscopy (SEM) has revolutionized how we explore the microscopic universe. Its ability to produce high-resolution, three-dimensional images makes it indispensable in nanotechnology. As research delves ever deeper into the nanoscale, SEM has become a cornerstone for unveiling intricate details of nanostructures, nanoparticles, and other advanced materials. The Science Behind SEM At its core, an SEM works by scanning a focused beam of electrons across a specimen’s surface. These electrons interact with atoms in the sample, generating signals that provide insights into the specimen’s topography, composition, and other key properties. By collecting secondary electrons, backscattered electrons, and characteristic X-rays, SEM delivers…

Scanning electron microscopy (SEM) is a transformative imaging technology that has reshaped research and industrial analysis. By harnessing an electron beam, SEMs deliver ultra-high-resolution images that reveal the intricate details of surfaces at the nanoscale—insights that conventional optical microscopes simply can’t provide. Rather than getting lost in technical details, let’s highlight the core strengths of SEM and why they’re indispensable in today’s scientific and industrial landscape. The Essentials of SEM At its simplest, an SEM uses a focused beam of electrons to probe a sample. When these electrons interact with the specimen, they generate signals that uncover critical information about surface…