FAQ of Scanning Electron Microscope (SEM)
The principle of a Scanning Electron Microscope (SEM) involves the emission of an electron beam from an electron gun, which is accelerated by an electric field. The electron beam scans the specimen surface line by line, exciting the specimen to produce various physical signals. These signals are collected by detectors and converted into video signals in sequential and proportional order. By detecting a specific signal, amplifying the video signal, and signal processing, a scanning image reflecting the surface features of the specimen is obtained on the display screen. Common Issues: 1. Does the magnetic nature of a specimen affect SEM testing? a. Magnetic Field Interference: The electron beam in SEM is focused by electromagnetic lenses. Magnetic…