Month: December 2024

Benchtop Electron Paramagnetic Resonance (EPR) spectrometers are compact, cost-effective, and user-friendly, making them ideal for labs with limited space or budgets. They provide reliable performance for analyzing free radicals, transition metals, and defects, with lower maintenance needs and simplified operation compared to traditional EPR systems. Several professional manufacturers in the United States offer benchtop EPR spectrometers. We have information here for researchers interested in purchasing one. Bruker Corporation: Bruker offers a range of Benchtop EPR instruments, including the EMXnano and EMXmicro series. Their instruments are known for their high sensitivity and versatility, allowing for a wide range of applications. CIQTEK: CIQTEK benchtop EPR spectrometers are…

Humans rely on their senses to perceive the world, and these microscopic analysis instruments extend human perception. We are all familiar with optical microscopes, but these microscopes, which work based on lens imaging, are limited by the Abbe limit, where the resolution is limited to half the wavelength of the light used. Therefore, the resolution of optical microscopes is only at the micrometer level due to the limitation of the wavelength of light. However, fast-moving electrons have wave-particle duality, and as a wave, an important characteristic of electrons is their wavelength. With increasing acceleration voltage, the electron wavelength decreases. By…

CIQTEK is excited to announce its strategic partnership with SYNERGIE4, which becomes the official distributor of CIQTEK Electron Microscopes in France.  This collaboration represents a milestone in SYNERGIE4’s commitment to delivering high-precision Scientific Instruments for analysis and research purposes. CIQTEK is renowned for its innovative technologies and exceptional performance in electron microscopy. SYNERGIE4 now offers a comprehensive range of electron microscopes tailored to meet specific customer requirements: 1. Tungsten Filament Scanning Electron Microscopes (SEM-W): Reliable and cost-effective models ideal for elemental analysis with excellent resolution capabilities. 2. Field Emission Scanning Electron Microscopes (SEM-FEG): High-end instruments designed for discerning users who demand superior precision and resolution. 3. Field Emission Scanning Electron Microscopes with Focused Ion Beam (SEM-FIB): An innovative solution providing…

The principle of a Scanning Electron Microscope (SEM) involves the emission of an electron beam from an electron gun, which is accelerated by an electric field.  The electron beam scans the specimen surface line by line, exciting the specimen to produce various physical signals. These signals are collected by detectors and converted into video signals in sequential and proportional order. By detecting a specific signal, amplifying the video signal, and signal processing, a scanning image reflecting the surface features of the specimen is obtained on the display screen. Common Issues: 1. Does the magnetic nature of a specimen affect SEM testing? a. Magnetic Field Interference: The electron beam in SEM is focused by electromagnetic lenses. Magnetic…