Month: April 2025

Scanning Electron Microscopes (SEMs) are crucial for high-resolution imaging and material analysis, and in the Middle East and Africa (MEA) and the Far East, balancing cost and performance is key. The market spans a wide range—from premium systems to budget-friendly alternatives—and includes well-known brands like JEOL, FEI (Thermo Fisher Scientific), and Hitachi, as well as emerging names like CIQTEK. Diverse Price Tiers in the SEM Market High-End Systems: Top-tier models from established manufacturers such as JEOL and FEI typically range between USD 300,000 and USD 600,000. These SEMs are equipped with state-of-the-art electron optics, multiple detector arrays, and advanced automation features, making…

Field Emission Scanning Electron Microscopy (FE-SEM) transforms scientific imaging with unparalleled precision, driving advancements in materials science, biomedical research, and nanotechnology. As industries demand higher resolution and accuracy, FE-SEM is emerging as the go-to tool for cutting-edge research. Market Growth and Forecast The FE-SEM market is experiencing significant growth, particularly as industries like nanotechnology, semiconductor manufacturing, and battery development push the need for more precise imaging. Increasing investments in research and development and advanced technologies ensure that demand continues to grow. This trend will continue in the coming years, making FE-SEM an important tool for cross-disciplinary research. CIQTEK is actively contributing…

Based on the Dual-beam Electron Microscope DB550 independently controlled by CIQTEK, the Transmission Electron Microscope (TEM) nanoscale sample preparation of 28nm process node chips was successfully achieved. TEM verification can clearly analyze the key dimensions of each structure, providing a domestic precision detection solution for semiconductor process defect analysis and yield improvement.