Author: sfyh

The Scanning Electron Microscope (SEM) is an important tool for observing micro-scale morphology and is widely used in fields such as materials science, biology, and environmental science. With the continuous development of technology, the Field Emission Scanning Electron Microscope (FESEM) has emerged. Compared to traditional SEM, FESEM offers advantages such as higher resolution, greater depth of field, and stronger signal stability. This article will provide a detailed introduction to the principles, characteristics, and advantages of FESEM compared to SEM. Principles of Field Emission Scanning Electron Microscope (FESEM): 1. Electron Source: FESEM uses a field emission electron source instead of the concurrent electron source used in SEM. The field emission electron source has higher…

Benchtop Electron Paramagnetic Resonance (EPR) spectrometers are compact, cost-effective, and user-friendly, making them ideal for labs with limited space or budgets. They provide reliable performance for analyzing free radicals, transition metals, and defects, with lower maintenance needs and simplified operation compared to traditional EPR systems. Several professional manufacturers in the United States offer benchtop EPR spectrometers. We have information here for researchers interested in purchasing one. Bruker Corporation: Bruker offers a range of Benchtop EPR instruments, including the EMXnano and EMXmicro series. Their instruments are known for their high sensitivity and versatility, allowing for a wide range of applications. CIQTEK: CIQTEK benchtop EPR spectrometers are…

Humans rely on their senses to perceive the world, and these microscopic analysis instruments extend human perception. We are all familiar with optical microscopes, but these microscopes, which work based on lens imaging, are limited by the Abbe limit, where the resolution is limited to half the wavelength of the light used. Therefore, the resolution of optical microscopes is only at the micrometer level due to the limitation of the wavelength of light. However, fast-moving electrons have wave-particle duality, and as a wave, an important characteristic of electrons is their wavelength. With increasing acceleration voltage, the electron wavelength decreases. By…

CIQTEK is excited to announce its strategic partnership with SYNERGIE4, which becomes the official distributor of CIQTEK Electron Microscopes in France.  This collaboration represents a milestone in SYNERGIE4’s commitment to delivering high-precision Scientific Instruments for analysis and research purposes. CIQTEK is renowned for its innovative technologies and exceptional performance in electron microscopy. SYNERGIE4 now offers a comprehensive range of electron microscopes tailored to meet specific customer requirements: 1. Tungsten Filament Scanning Electron Microscopes (SEM-W): Reliable and cost-effective models ideal for elemental analysis with excellent resolution capabilities. 2. Field Emission Scanning Electron Microscopes (SEM-FEG): High-end instruments designed for discerning users who demand superior precision and resolution. 3. Field Emission Scanning Electron Microscopes with Focused Ion Beam (SEM-FIB): An innovative solution providing…

The principle of a Scanning Electron Microscope (SEM) involves the emission of an electron beam from an electron gun, which is accelerated by an electric field.  The electron beam scans the specimen surface line by line, exciting the specimen to produce various physical signals. These signals are collected by detectors and converted into video signals in sequential and proportional order. By detecting a specific signal, amplifying the video signal, and signal processing, a scanning image reflecting the surface features of the specimen is obtained on the display screen. Common Issues: 1. Does the magnetic nature of a specimen affect SEM testing? a. Magnetic Field Interference: The electron beam in SEM is focused by electromagnetic lenses. Magnetic…

With the widespread use of gamma rays in industries, agriculture, medicine, and food, accurate measurement of radiation dose has become increasingly important. EPR Spectrometer is currently the only direct method to detect unpaired electrons in a sample, allowing for the precise measurement of radiation dose by detecting the free radicals generated in the irradiated material. The radiation dose can be categorized into low dose (less than 1 kGy), medium dose (1-10 kGy), and high dose (greater than 10 kGy), and its effects can range from no clinical symptoms to severe symptoms, early fatal clinical symptoms, and early death. After decades of research, various…

November 2024 – CIQTEK, a leading manufacturer in high-end scientific instrument research and development, proudly announces another successful round of shipments. As of November this year, the company has delivered its latest range of Electron Microscope products to more than 40 countries worldwide. The international customers have expressed unanimous satisfaction with the performance and quality of CIQTEK’s offerings, further solidifying their reputation as a trusted provider in the field. CIQTEK’s commitment to excellence is evident in its unwavering dedication to serving researchers across various disciplines. With a strong focus on innovation and advanced technology, the company strives to meet the evolving demands of scientists and…