CIQTEK’s SEM Technology Receives High Praise from Visiting Customers
CIQTEK, recently welcomed esteemed customers, Dan from the United Kingdom and Philippe from France, who visited the company to explore its cutting-edge Scanning Electron Microscope (SEM). Both customers were highly impressed with CIQTEK’s SEM technology, which combines superior engineering, design features, and user-friendly functionalities. During their visit, Dan and Philippe brought their own sample demos and conducted experiments using the CIQTEK SEM. They expressed their utmost satisfaction with the quality of the imaging results obtained. The SEM’s capabilities surpassed their expectations, enabling them to capture and examine their samples with remarkable detail and accuracy. The CIQTEK SEM stands out by integrating the best-in-class engineering and design features.…