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Creating a perfect image requires a combination of theoretical knowledge and practical experience and a balance between many factors. This process may encounter some challenging issues in the use of  Electron Microscope. Astigmatism is one of the most difficult corrections to make in an image and requires practice. The middle image in the following figure is a correctly focused image after astigmatism correction. The left and right images are examples of poor astigmatism correction, resulting in stretched stripes in the image. To achieve precise imaging, the cross-section of the Electron Beam (probe) should be circular when it reaches the specimen. The cross-section of…

Focused Ion Beam (FIB) is a microfabrication instrument that utilizes an electron lens to focus an ion beam into a very small size for precision cutting. Liquid Metal Ion Source The ion source is the heart of the FIB system, and the accurate focusing of the ion beam begins with the emergence of liquid metal ion sources. The ions generated by liquid metal ion sources, mostly utilizing gallium (Ga) as the metal material, have high brightness and petite source sizes. Liquid metal ion sources are formed by the field-induced ion emission from a liquid metal surface under a strong electric…

Introduction to EPR Spectroscopy and Its European Market Electron Paramagnetic Resonance (EPR) spectroscopy plays a central role in analyzing materials with unpaired electrons—ranging from transition metal complexes to free radicals in biological systems. Europe has long been a powerhouse in magnetic resonance research, with universities and research institutions across Germany, France, the UK, and the Nordics leading innovation in this field. This high demand has fostered a sophisticated market for EPR spectrometers—both from traditional manufacturers and emerging players introducing new approaches to usability, integration, and pricing. Overview of Leading European EPR Spectrometer Manufacturers Europe is home to several key players in the EPR…

Scanning Electron Microscopes (SEMs) are crucial for high-resolution imaging and material analysis, and in the Middle East and Africa (MEA) and the Far East, balancing cost and performance is key. The market spans a wide range—from premium systems to budget-friendly alternatives—and includes well-known brands like JEOL, FEI (Thermo Fisher Scientific), and Hitachi, as well as emerging names like CIQTEK. Diverse Price Tiers in the SEM Market High-End Systems: Top-tier models from established manufacturers such as JEOL and FEI typically range between USD 300,000 and USD 600,000. These SEMs are equipped with state-of-the-art electron optics, multiple detector arrays, and advanced automation features, making…

Field Emission Scanning Electron Microscopy (FE-SEM) transforms scientific imaging with unparalleled precision, driving advancements in materials science, biomedical research, and nanotechnology. As industries demand higher resolution and accuracy, FE-SEM is emerging as the go-to tool for cutting-edge research. Market Growth and Forecast The FE-SEM market is experiencing significant growth, particularly as industries like nanotechnology, semiconductor manufacturing, and battery development push the need for more precise imaging. Increasing investments in research and development and advanced technologies ensure that demand continues to grow. This trend will continue in the coming years, making FE-SEM an important tool for cross-disciplinary research. CIQTEK is actively contributing…

Based on the Dual-beam Electron Microscope DB550 independently controlled by CIQTEK, the Transmission Electron Microscope (TEM) nanoscale sample preparation of 28nm process node chips was successfully achieved. TEM verification can clearly analyze the key dimensions of each structure, providing a domestic precision detection solution for semiconductor process defect analysis and yield improvement.

CIQTEK demonstrated the remarkable capabilities of its EPR200M at The French Association of Electronic Paramagnetic Resonance (ARPE) conference. The event was marked by a presentation and an impressive turnout of attendees, with the EPR system attracting substantial attention and generating lively discussions. During the conference, CIQTEK’s booth was constantly surrounded by researchers and enthusiasts eager to learn more about the EPR200M. Even during the coffee breaks, numerous foreign researchers actively engaged in discussions around the informative posters and promotional materials displayed by CIQTEK. The company’s commitment to fostering knowledge exchange and collaboration was evident throughout the conference. In recognition of exceptional research work, the prestigious Poster Prize at…

Electron Paramagnetic Resonance (EPR) spectroscopy is a critical technique for studying the electronic properties of paramagnetic species, and temperature control plays a central role in the accuracy and reliability of EPR measurements. Variable Temperature (VT) Systems allow researchers to investigate temperature-dependent phenomena, providing a direct window into spin dynamics, phase transitions, and other subtle effects. The Role of Temperature Control in EPR Temperature is a key variable in EPR experiments. Precise control helps to: Technical Features of Modern VT Systems Contemporary VT systems are designed to cover a wide temperature range—from cryogenic levels (around 4 K using liquid helium or closed-cycle cryostats) up to around…

Scanning Electron Microscopy (SEM) has become an indispensable tool in various scientific and industrial fields, enabling researchers to explore the micro- and nanoscale world with unprecedented clarity. High-resolution SEM, in particular, has revolutionized materials science, life sciences, and semiconductor research, providing exceptional imaging capabilities and analytical precision. In Europe, where cutting-edge research and advanced manufacturing thrive, high-resolution SEM is a key driver of innovation. The Growing Demand for High-Resolution SEM in Europe Europe has long been at the forefront of scientific and technological advancements, with institutions and industries demanding ever-more precise imaging solutions. The rise of nanotechnology, semiconductor miniaturization, and biomaterial research has…

CIQTEK is pleased to announce its participation in the upcoming Experimental Nuclear Magnetic Resonance Conference (ENC) 2025 ENC-ISMAR Joint Conference. The conference is set to take place from April 6 to 10 in Pacific Grove, California. The ENC-ISMAR Joint Conference is a prominent event that brings together experts, researchers, and industry professionals from around the world to discuss advancements, breakthroughs, and applications in the field of Nuclear Magnetic Resonance (NMR) and Electron Paramagnetic Resonance (EPR) Spectrometer. The conference serves as a platform for collaboration, knowledge sharing, and the exchange of ideas on cutting-edge research and development. CIQTEK invites conference attendees to visit their booth at the…